Register, August, 1993, No. 452
Chapter NR 264
ELECTRICAL AND ELECTRONIC COMPONENTS
NR 264.03 General definitions.
NR 264.04 Alternative to monitoring for total toxic organics.
NR 264.05 Compliance dates.
Subchapter I — Semiconductor Subcategory
NR 264.10 Applicability; description of the semiconductor subcategory.
NR 264.11 Specialized definitions.
NR 264.12 Effluent limitations representing the degree of effluent reduction attainable by the application of the best practicable control technology currently available.
NR 264.13 Effluent limitations representing the degree of effluent reduction attainable by the application of the best available technology economically achievable.
NR 264.14 New source performance standards.
NR 264.15 Pretreatment standards for existing sources.
NR 264.17 Effluent limitations representing the degree of effluent reduction attainable by the application of the best conventional pollutant control technology.
Subchapter II — Electronic Crystals Subcategory
NR 264.20 Applicability; description of the electronic crystals subcategory.
NR 264.21 Specialized definitions.
NR 264.22 Effluent limitations representing the degree of effluent reduction attainable by the application of the best practicable control technology currently available.
NR 264.23 Effluent limitations representing the degree of effluent reduction attainable by the application of the best available technology economically achievable.
NR 264.24 New source performance standards.
NR 264.25 Pretreatment standards for existing sources.
NR 264.26 Pretreatment standards for new sources.
NR 264.27 Effluent limitations representing the degree of effluent reduction attainable by the application of the best conventional pollutant control technology.
Subchapter III — Cathode Ray Tube Subcategory
NR 264.30 Applicability; description of the cathode ray tube subcategory.
NR 264.31 Specialized definitions.
NR 264.32 New source performance standards.
NR 264.33 Pretreatment standards for existing sources.
NR 264.34 Pretreatment standards for new sources.
Subchapter IV — Luminescent Materials Subcategory
NR 264.40 Applicability; description of the luminescent materials subcategory.
NR 264.41 New source performance standards.
NR 264.42 Pretreatment standards for new sources.
NR 264.01
NR 264.01
Purpose. The purpose of this chapter is to establish effluent limitations, performance standards, and pretreatment standards for discharges of process wastes from the electrical and electronic components category of point sources and its subcategories.
NR 264.01 History
History: Cr.
Register, May, 1990, No. 413, eff. 6-1-90.
NR 264.02
NR 264.02
Applicability. This chapter applies to any manufacturing operation which produces semiconductors, electronic crystals, cathode ray tubes, or luminescent materials and which discharges or may discharge process wastewater pollutants to waters of the state or into a publicly owned treatment works.
NR 264.02 History
History: Cr.
Register, May, 1990, No. 413, eff. 6-1-90.
NR 264.03
NR 264.03
General definitions. The following definitions are applicable to the terms used in this chapter. Definitions of other terms and abbreviations are set forth in
ss. NR 205.03,
205.04 and
211.03.
NR 264.03(1)
(1) “Existing source” means any point source, except a new source as defined in
sub. (2), from which pollutants may be discharged either into waters of the state or into a publicly owned treatment works.
NR 264.03(2)
(2) “New source” means any point source from which pollutants are or may be discharged directly to waters of the state or into a publicly owned treatment works and for which construction commenced after August 24, 1982, for point sources subject to the semiconductor and electronic crystals subcategory or March 9, 1983, for point sources subject to the cathode ray tube and luminescent materials subcategories.
NR 264.03 History
History: Cr.
Register, May, 1990, No. 413, eff. 6-1-90.
NR 264.04
NR 264.04
Alternative to monitoring for total toxic organics. NR 264.04(1)(1) Instead of monitoring for TTO, the certification set forth in
sub. (3) may be used as a comment within the discharge monitoring report required by
s. NR 205.07 (3) (d) or
211.15 (4), if the following 4 conditions are met:
NR 264.04(1)(a)
(a) A direct discharger has submitted a solvent management plan to the department; a source which discharges to a POTW has submitted a solvent management plan to the control authority;
NR 264.04(1)(b)
(b) The department or control authority has approved the solvent management plan;
NR 264.04(1)(c)
(c) The solvent management plan has been incorporated into the discharger's permit; and
NR 264.04(1)(d)
(d) The solvent management plan is being implemented to the satisfaction of the department or control authority.
NR 264.04(2)
(2) The solvent management plan shall specify the following:
NR 264.04(2)(b)
(b) A toxic organic compound disposal method other than dumping, such as reclamation, contract hauling, or incineration.
NR 264.04(2)(c)
(c) The procedures used to assure that toxic organic compounds do not routinely spill or leak into the wastewater.
“Based on my inquiry of the person or persons directly responsible for managing compliance with the permit limitation for total toxic organics (TTO), I certify that, to the best of my knowledge and belief, no dumping of concentrated toxic organics into the wastewaters has occurred since the filing of the last discharge monitoring report. I further certify that this facility is implementing the solvent management plan submitted to the department or POTW.”
NR 264.04 History
History: Cr.
Register, May, 1990, No. 413, eff. 6-1-90.
NR 264.05(1)(1) The following compliance dates apply to any source subject to this chapter which discharges to waters of the state:
NR 264.05(1)(a)
(a) Any existing source shall achieve the effluent limitations representing BPT by July 1, 1977.
NR 264.05(1)(b)
(b) Except as provided in
par. (c), any existing source shall achieve the effluent limitations representing BAT and BCT by July 1, 1984.
NR 264.05(1)(c)
(c) Existing sources subject to the semiconductor subcategory or the electronic crystals subcategory shall achieve the BAT effluent limitation for fluoride by November 11, 1985.
NR 264.05(1)(d)
(d) Any new source subject to this chapter shall achieve NSPS at the commencement of discharge.
NR 264.05(2)
(2) The following compliance dates apply to sources subject to this chapter which introduce process wastewater pollutants into a POTW:
NR 264.05(2)(a)
(a) Any existing source subject to the semiconductor subcategory shall achieve PSES by July 1, 1984.
